Diamond as X-ray Wavelength Standard for Thermal-Expansion Studies Using Synchrotron Sources

Wojciech Paszkowicz 5Paweł Piszora 3Roman Minikayev 5Jianzhong Jiang 2Michael Knapp 1Carsten Baehtz 1Rajmund Bacewicz 4

1. Hamburger Synchrotronstrahlungslabor HASYLAB (HASYLAB), Notkestrasse 85, Hamburg D-22603, Germany
2. Department of Physics, Technical University of Denmark, Building 307, Lyngby DK-2800, Denmark
3. Adam Mickiewicz University, Faculty of Chemistry, Grunwaldzka 6, Poznań 60-780, Poland
4. Warsaw University of Technology, Faculty of Physics, Koszykowa 75, Warszawa 00-662, Poland
5. Polish Academy of Sciences, Institute of Physics, al. Lotników 32/46, Warszawa 02-668, Poland


Synchrotron radiation has an important advantage of high flux on even small samples. In particular, the in-situ or ex-situ high-pressure studies are performed almost entirely at synchrotron beamlines. Users of synchrotron beams are aware of possible wavelength instabilities which may arise during the measurements (illustrated e.g. in [1]). The instabilities are due largely to thermomechanical phenomena at primary-beam monochromators. For many purposes, the instabilities can be neglected. The stability requirements are particularly severe in thermal expansion measurements, as the changes of the lattice constants with temperature are extremely small. In such studies we have noticed that different a(T) runs of the given material differ slightly. Using an internal wavelength standard was expected to reduce this effect. The diamond standard was chosen because of its known small thermal expansivity making that the possible effect, due to impurities or to the defect structure of the standard, on the final result is also small. We used a 99.9% pure diamond powder with single crystal grains of about one micrometer size. The low-temperature XRD measurements were carried out at a powder diffractometer (for construction details see [2]) at the B2 bending-magnet beamline using Debye-Scherrer geometry. The closed-circuit He-cryostat ensured good temperature stability and accuracy. The results of thermal expansion coefficient measured for several materials in the 10-300 K range using the diamond standard are found to be reproducible. Moreover, they exhibit a good agreement with the first-principles theoretical calculations.

1. Cernik, R. J. and Louer, D., J. Appl. Crystallogr. 26 (1993) 277.
2. J. Ihringer and A. Koester, J. Appl. Crystallogr. 26 (1993) 135.

Related papers
  1. Defect distribution along needle-shaped PrVO4 single crystals grown by the slow-cooling method
  2. The influence of growth atmosphere on the self-selection of the grains during ZnO crystal growth
  3. New Ca10Li(VO4)7 laser host: growth and properties
  4. Up-conversion and down-conversion processes observed in Er3+, Yb3+ and Mn2+ doped ZnAl2O4 nanoparticles
  5. Synthesis and properties of up-converted NaYF4: Er, Yb nanoparticles for biomedical applications
  6. Structural, morphological and optical properties of ZnAl2O4 nanoparticles co-doped with Er3+and Yb3+ prepared by combustion aerosol synthesis.
  7. Synthesis and properties of NaYF4: Er, Yb, Gd nanoparticles with and without SiO2 coating for biomedical applications.
  8. Designing biosensors based on semiconductor nanoparticles for an early detection of neurodegenerative diseases.
  9. Structural properties and compressibility of spinels: More questions than answers
  10. High-pressure diffraction study of structural and elastic properties of zircon-type and scheelite-type RVO4 (R = Nd, Eu)
  11. Elastic properties of dysprosium orthovanadate: An in-situ powder-diffraction study
  12. Thermal expansion of Si3N4 and Ge3N4
  13. Local structure around Te in heavily doped GaAs:Te using X-ray absorption fine structure
  14. ZnO and core/shell ZnO/ZnS nanofibers: Characterization and applications
  15. Zinc oxide grown by Atomic Layer Deposition - a material for novel 3D electronics
  16. Thin films of ZnS and ZnSe by Atomic Layer Deposition for light sensor applications
  17. Effects related to deposition temperature of ZnCoO films grown by Atomic Layer Deposition – uniformity of Co distribution, structural, electric and magnetic properties
  18. Pressure dependence of lattice parameter of Gadolinium Gallium Garnet crystals
  19. Lattice parameters of hard materials in the low-temperature range
  20. Lattice parameters of a wurtzite-type (Zn,Mg)Se crystal as a function of temperature
  21. Rietveld refinement for Li2Si2O5 doped with vanadium
  22. High-pressure diffraction study of α and β Ge3N4
  23. Effect of annealing on the structure and microstructure of Pr doped ZrO2-Y2O3 nanocrystals
  24. Synchrotron X-ray diffraction studies of products of the steel pipe corrosion measured in the native aqueous suspension
  25. The materials science and powder diffraction beamline at ALBA
  26. Influence of Lanthanum doping on the morphotropic phase boundary in lead zirconate titanate
  27. ZnO thin films for organic/inorganic heterojunctions
  28. Optimisation of parameters of a dynamic penalty function for a test example of powder pattern indexing
  29. Single crystals of gallium nitride doped with gadolinium- synthesis and properties.
  30. Wide band-gap II-VI semiconductors for optoelectronic applications
  31. Low temperature ZnMnO by ALD
  32. Structure and "Ferromagnetism" of ZnO
  33. Substrate effect on the ground state of the magnetic order in NSMO/YBCO superlattices
  34. Method of Manganese co-doping of LT ZnO films
  35. Ferromagnetism in ZnO:Mn thin films deposited by PEMOCVD
  36. Metastable Phase and Structural Transitions of Superthin Ti/Si and TiN/SiN Multilayers
  37. Structure properties of bulk ZnO crystals
  38. Magnetic anisotropy and structural properties of ferromagnet/MgO/ferromagnet system
  39. Studies of Mn incorporation in GaAs close to the equilibrium doping limit
  40. Rietveld refinement for polycrystalline indium nitride
  42. Promising high quality short period Fe/Fe-N multilayers deposited by the sputtering
  43. Structural and Magnetic Properties of Cr/Gd Multilayers Deposited on Sapphire and MgO Substrates
  44. X-ray diffraction studies of thermal-expansion with the use of 1D detectors installed at synchrotron beamlines
  45. Sensitivity of a genetic algorithm to the mutation rate parameter value: results for a crystallographic test
  46. Structural analysis of reactively sputtered W-Ti-N thin films
  47. Rietveld refinement of powder diffraction data collected with a laboratory diffractometer equipped with a linear X-ray detector
  48. Phase relationships in annealed Cu-Al-O layers
  49. Growth and characterization of thin films of ZnO by Atomic Layer Epitaxy
  50. Diffusion barrier properties of reactively sputtered W-Ti-N thin films
  51. Area detector as a tool to study properties of the magnetic multilayers by the neutron scattering
  52. Influence of hydrogen adsorption on magnetic properties of Fe films and multilayers
  53. Transmission electron microscopy and X-ray diffraction study of α'-Al2 CO crystals
  54. X-Ray Study of Lattice Parameters of GaN in a Broad Temperature Range
  55. X-ray powder diffraction investigation of lithium manganese spinel oxides with cubic, tetragonal and orthorhombic structure.
  56. Characterization of the c- BN/ TiC, Ti3SiC2, TiN systems by element selective spectroscopy
  57. Structural Stability in Nanocrystals

Presentation: oral at E-MRS Fall Meeting 2003, Symposium B, by Wojciech Paszkowicz
See On-line Journal of E-MRS Fall Meeting 2003

Submitted: 2003-05-26 19:30
Revised:   2014-10-06 14:03
Web science24.com
© 1998-2018 pielaszek research, all rights reserved Powered by the Conference Engine