Variation of unit-cell size of indium nitride with temperature has been studied in Refs. [1-3]. The low-temperature range has been only partially explored up to now. In the present study, the lattice parameters for indium nitride were determined using X-ray powder diffraction at a synchrotron radiation source (beamline B2, Hasylab/DESY, Hamburg) in the temperature range from 22 K up to 310 K. An image-plate detector was applied for data collection. The wavelength was calibrated using internal diamond standard, according to the method described in Ref. [4]. The lattice parameters a and c behave in a similar way: they are virtually constant below about 130 K. In the range 200 to 300 K the variation is close to a linear one. Discussion of the results will involve the earlier studies of thermal expansion of indium nitride.

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2. Paszkowicz W, Cerny R, Krukowski S, Powder Diffr. 18 (2003) 114-121
3. Wang K, Reeber RR, Appl. Phys. Lett. 79 (2001) 1602-1604
4. Paszkowicz W, Knapp M, Baehtz C, Minikayev R, Piszora P, Jiang JZ, Bacewicz R, J. Alloys Compds. 382 (2004) 107-111