LATTICE PARAMETERS OF INDIUM NITRIDE IN THE 22-310 K TEMPERATURE RANGE
|Wojciech Paszkowicz 3, Paweł Piszora 2, Roman Minikayev 3, Michael Knapp 5, Carsten Baehtz 1, Sławomir Podsiadło 4|
1. Hamburger Synchrotronstrahlungslabor HASYLAB (HASYLAB), Notkestrasse 85, Hamburg D-22603, Germany
Variation of unit-cell size of indium nitride with temperature has been studied in Refs. [1-3]. The low-temperature range has been only partially explored up to now. In the present study, the lattice parameters for indium nitride were determined using X-ray powder diffraction at a synchrotron radiation source (beamline B2, Hasylab/DESY, Hamburg) in the temperature range from 22 K up to 310 K. An image-plate detector was applied for data collection. The wavelength was calibrated using internal diamond standard, according to the method described in Ref. . The lattice parameters a and c behave in a similar way: they are virtually constant below about 130 K. In the range 200 to 300 K the variation is close to a linear one. Discussion of the results will involve the earlier studies of thermal expansion of indium nitride.
Presentation: poster at E-MRS Fall Meeting 2005, Symposium A, by Wojciech Paszkowicz
See On-line Journal of E-MRS Fall Meeting 2005
Submitted: 2005-06-28 21:24 Revised: 2009-06-07 00:44