dr Wojciech Paszkowicz

e-mail:
phone: +48-22-8436034
fax: +48-22-8430926
web:
interest(s): powder diffraction, comutational methods in crystallography

Affiliation:


Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Participant:


E-MRS Fall Meeting 2003

began: 2003-09-15
ended: 2003-09-11
Presented:

E-MRS Fall Meeting 2003

X-Ray Study of Lattice Parameters of GaN in a Broad Temperature Range

E-MRS Fall Meeting 2003

Diamond as X-ray Wavelength Standard for Thermal-Expansion Studies Using Synchrotron Sources

Participant:


E-MRS Fall Meeting 2004

began: 2004-09-06
ended: 2004-09-10
Presented:

E-MRS Fall Meeting 2004

Rietveld refinement of powder diffraction data collected with a laboratory diffractometer equipped with a linear X-ray detector

E-MRS Fall Meeting 2004

Sensitivity of a genetic algorithm to the mutation rate parameter value: results for a crystallographic test

Participant:


E-MRS Fall Meeting 2005

began: 2005-09-05
ended: 2005-09-09
Presented:

E-MRS Fall Meeting 2005

LATTICE PARAMETERS OF INDIUM NITRIDE IN THE 22-310 K TEMPERATURE RANGE


Participant:


E-MRS Fall Meeting 2007

began: 2007-09-17
ended: 2007-11-30
Presented:

E-MRS Fall Meeting 2007

Optimisation of parameters of a dynamic penalty function for a test example of powder pattern indexing

Participant:


11th European Powder Diffraction Conference

began: 2008-09-19
ended: 2008-09-22
Presented:

11th European Powder Diffraction Conference

Lattice parameters of hard materials in the low-temperature range

11th European Powder Diffraction Conference

Lattice parameters of a wurtzite-type (Zn,Mg)Se crystal as a function of temperature

11th European Powder Diffraction Conference

Pressure dependence of lattice parameter of Gadolinium Gallium Garnet crystals

11th European Powder Diffraction Conference

Rietveld refinement for Li2Si2O5 doped with vanadium

Publications:


  1. Area detector as a tool to study properties of the magnetic multilayers by the neutron scattering
  2. Diamond as X-ray Wavelength Standard for Thermal-Expansion Studies Using Synchrotron Sources
  3. Effect of annealing on the structure and microstructure of Pr doped ZrO2-Y2O3 nanocrystals
  4. Ferromagnetism in ZnO:Mn thin films deposited by PEMOCVD
  5. Growth and characterization of thin films of ZnO by Atomic Layer Epitaxy
  6. High-pressure diffraction study of α and β Ge3N4
  7. Influence of hydrogen adsorption on magnetic properties of Fe films and multilayers
  8. Lattice parameters of a wurtzite-type (Zn,Mg)Se crystal as a function of temperature
  9. Lattice parameters of hard materials in the low-temperature range
  10. Low temperature ZnMnO by ALD
  11. Magnetic anisotropy and structural properties of ferromagnet/MgO/ferromagnet system
  12. Method of Manganese co-doping of LT ZnO films
  13. Optimisation of parameters of a dynamic penalty function for a test example of powder pattern indexing
  14. Phase relationships in annealed Cu-Al-O layers
  15. LATTICE PARAMETERS OF INDIUM NITRIDE IN THE 22-310 K TEMPERATURE RANGE

  16. Promising high quality short period Fe/Fe-N multilayers deposited by the sputtering

  17. Pressure dependence of lattice parameter of Gadolinium Gallium Garnet crystals
  18. Rietveld refinement for polycrystalline indium nitride

  19. Structural and Magnetic Properties of Cr/Gd Multilayers Deposited on Sapphire and MgO Substrates

  20. Rietveld refinement for Li2Si2O5 doped with vanadium
  21. Rietveld refinement of powder diffraction data collected with a laboratory diffractometer equipped with a linear X-ray detector
  22. Sensitivity of a genetic algorithm to the mutation rate parameter value: results for a crystallographic test
  23. Structure properties of bulk ZnO crystals
  24. Substrate effect on the ground state of the magnetic order in NSMO/YBCO superlattices
  25. Transmission electron microscopy and X-ray diffraction study of α'-Al2 CO crystals
  26. Wide band-gap II-VI semiconductors for optoelectronic applications
  27. X-ray diffraction studies of thermal-expansion with the use of 1D detectors installed at synchrotron beamlines
  28. X-Ray Study of Lattice Parameters of GaN in a Broad Temperature Range
  29. ZnO thin films for organic/inorganic heterojunctions



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