Crystallite size determination from diffraction data: a do-it-yourself tutorial.  

Stanisław Gierlotka 

Polish Academy of Sciences, Institute of High Pressure Physics (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland

Abstract

A method of determination of the size distribution of nanocrystals from X-Ray diffraction data will be presented. A brief introduction into experimental techniques will be given and the essential theoretical issues will be explained. A practical demonstration of the data analysis with an application of freely available software will be carried out. Limitations of the method and possible pitfalls will be discussed. Some particularly peculiar and challenging cases of data analysis will be presented.

 

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Presentation: Invited oral at Nano and Advanced Materials Workshop and Fair, by Stanisław Gierlotka
See On-line Journal of Nano and Advanced Materials Workshop and Fair

Submitted: 2013-07-23 12:10
Revised:   2013-07-23 12:10