Mike Leszczynski
e-mail:
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phone:
+4(0) 602391349
fax:
+48 (22) 632421
web:
interest(s):
Affiliation:
Polish Academy of Sciences, Institute of High Pressure Physics
address:
Sokolowska 29/37, Warszawa, 01-142,
Poland
phone:
+48-22-6324302
fax:
+48-22-6324218
web:
http://www.unipress.waw.pl
Participant:
E-MRS Fall Meeting 2002
began:
2002-09-15
ended:
2002-09-19
Presented:
Participant:
E-MRS Fall Meeting 2005
began:
2005-09-05
ended:
2005-09-09
Presented:
Participant:
Nano2business workshop
began:
2007-02-07
ended:
2007-02-09
Presented:
Nano2business workshop
Blue laser diodes manufacturing in Poland
Participant:
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
began:
2007-05-20
ended:
2007-05-24
Presented:
Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth
X-ray Diffraction as a Tool of InGaN layer Characterization.
Publications:
Blue laser diodes manufacturing in Poland
Bowing of epitaxial structures grown on bulk GaN substrates
Built-in electric fields in group III-nitride light emitting quantum structures
Microstructure of homoepitaxially grown InGaN/GaN, violet light emitting laser diodes.
PLASTIC PROPERTIES OF GaN AND Al
2
O
3
CRYSTAL: FEM-SIMULATION OF NANOINDENTATION CONFIRMED BY HIGH-RESOLUTION MICROSCOPY
Polymer film-coated high electron mobility transistors, based on GaN heterostructures, as sensors for some benzene derivatives
Rietveld refinement for polycrystalline indium nitride
The Blue Laser
The optimalisation of the GaN and GaN/AlGaN heterojunctions on bulk crystals using plasma-assisted molecular beam epitaxy
X-ray Diffraction as a Tool of InGaN layer Characterization.
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