Krystyna Golaszewska

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Affiliation:


Institute of Electron Technology

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: (4822)5487792
fax: (4822)8470631
web: http://www.neti.ite.waw.pl

Participant:


E-MRS Fall Meeting 2003

began: 2003-09-15
ended: 2003-09-11
Presented:

E-MRS Fall Meeting 2003

Study of Long-Term Stability of Ohmic Contacts to GaN

Participant:


Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

began: 2007-05-20
ended: 2007-05-24
Presented:

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

Comparison of various GaSb-based device structures for application in thermophotovoltaic cells

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

Photothermal investigations of SiC thermal properties

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

Liquid phase growth and characterization of laterally overgrown GaSb epitaxial layers

Publications:


  1. Characterization of Ir and IrO2 Schottky contacts on n-type 4H-SiC under high temperature stress
  2. Comparison of various GaSb-based device structures for application in thermophotovoltaic cells
  3. Determination of stress in composite engineered substrates for GaN-based RF power devices
  4. Diffusion barrier properties of reactively sputtered W-Ti-N thin films
  5. Liquid phase growth and characterization of laterally overgrown GaSb epitaxial layers
  6. NANOCOMPOSITE PHOTONIC SENSORS: FIRST APPROACH BY THE NANOPHOS INITIATIVE
  7. Optimisation of electrochemical sulphur treatment of GaSb and related semiconductors: application to surface passivation of GaSb/In(Al)GaAsSb TPV cells
  8. Photothermal investigations of SiC thermal properties
  9. p-type conducting ZnO: fabrication and characterisation
  10. Study of Long-Term Stability of Ohmic Contacts to GaN
  11. TaSiN, TiSiN and TiWN diffusion barriers for metallization systems to GaN
  12. Thermally stable Ru-Si-O gate electrode for AlGaN/GaN HEMT
  13. Transparent Conducting Oxides as Ohmic Contacts for GaSb-based Thermophotovoltaic Cells



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