Krzysztof Kopalko

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Affiliation:


Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Participant:


E-MRS Fall Meeting 2004

began: 2004-09-06
ended: 2004-09-10
Presented:

E-MRS Fall Meeting 2004

Growth and characterization of thin films of ZnO by Atomic Layer Epitaxy

Participant:


Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

began: 2007-05-20
ended: 2007-05-24
Presented:

Joint Fith International Conference on Solid State Crystals & Eighth Polish Conference on Crystal Growth

ZnMnO Films grown by Atomic Layer Deposition with uniform Mn distribution

Participant:


E-MRS Fall Meeting 2007

began: 2007-09-17
ended: 2007-11-30
Presented:

Publications:


  1. Effect of annealing on electrical properties of low temperature ZnO films
  2. Effect of the Annealing Atmosphere on the Quality of ZnO Crystal Surface
  3. Growth and characterization of thin films of ZnO by Atomic Layer Epitaxy
  4. Low temperature ZnMnO by ALD
  5. Mn doped ZnTe (110) (1x1) surface in Resonant Photoemission study
  6. Wide band-gap II-VI semiconductors for optoelectronic applications
  7. ZnMnO Films grown by Atomic Layer Deposition with uniform Mn distribution
  8. ZnO homoepitaxial growth by Atomic Layer Epitaxy technique.
  9. ZnO thin films for organic/inorganic heterojunctions



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