- Krystyna J. Mazur

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Affiliation:


Institute of Electronic Materials Technology

address: , Warszawa, 01919, Poland
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Participant:


IX Krajowe Sympozjum Użytkowników Promieniowania Synchrotronowego

began: 2011-09-26
ended: 2011-09-27
Presented:

IX Krajowe Sympozjum Użytkowników Promieniowania Synchrotronowego

Topographic and reflectometric investigation of 4H silicon carbide epitaxial layer deposited at various growth rates

Publications:


  1. Topographic and reflectometric investigation of 4H silicon carbide epitaxial layer deposited at various growth rates



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