Krystyna Lawniczak-Jablonska

e-mail:
phone: + 48 22 843 6034
fax: + 48 22 843 0926
web:
interest(s):

Affiliation:

Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Participant:

E-MRS Fall Meeting 2003

began: 2003-09-15
ended: 2003-09-11
Presented:
E-MRS Fall Meeting 2003
Use of element selective methods for characterization of thin films
E-MRS Fall Meeting 2003
Synchrotron Radiation - Sources and Properties

Publications:
  1. Analysis of stress in buried Ge layers by means of X-ray fluorescence
  2. CBN-Ti/TiN composites: hardness and chemical equilibrium as function of temperature
  3. Characterization of the c- BN/ TiC, Ti3SiC2, TiN systems by element selective spectroscopy
  4. Electronic structure of Mn atoms in (Ga,Mn)As layers modified by high temperature annealing
  5. EXAFS investigation of the local atomic structure of di-alanino acid derivative of protoporphyrin IX
  6. Influence of high temperature annealing on the local atomic structure around Mn atoms and magnetic properties of (Ga,Mn)As layers
  7. Investigation of Ge quantum dots buried in silicon matrix by x-ray absorption
  8. Synchrotron Radiation - Sources and Properties
  9. Total electron yield X- ray absorption applied for hard materials studies
  10. Use of element selective methods for characterization of thin films
  11. X-ray fluorescence detection of iron in diaminoacid derivatives of protoporhyrin IX.



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