Eliana Kaminska

e-mail:
fax: +48(22)8470631
web: http://www.ite.waw.pl
interest(s):

Affiliation:


Institute of Electron Technology

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: (4822)5487792
fax: (4822)8470631
web: http://www.neti.ite.waw.pl

Participant:


E-MRS Fall Meeting 2004

began: 2004-09-06
ended: 2004-09-10
Presented:

E-MRS Fall Meeting 2004

NANOCOMPOSITE PHOTONIC SENSORS: FIRST APPROACH BY THE NANOPHOS INITIATIVE

E-MRS Fall Meeting 2004

Thermally stable Ru-Si-O gate electrode for AlGaN/GaN HEMT

E-MRS Fall Meeting 2004

TaSiN, TiSiN and TiWN diffusion barriers for metallization systems to GaN

E-MRS Fall Meeting 2004

p-type conducting ZnO: fabrication and characterisation

E-MRS Fall Meeting 2004

Transparent Conducting Oxides as Ohmic Contacts for GaSb-based Thermophotovoltaic Cells

Publications:


  1. Determination of stress in composite engineered substrates for GaN-based RF power devices
  2. Photothermal investigations of SiC thermal properties
  3. p-type conducting ZnO: fabrication and characterisation
  4. Thermally stable Ru-Si-O gate electrode for AlGaN/GaN HEMT



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