Piotr Dłużewski

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Affiliation:


Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Participant:


E-MRS Fall Meeting 2003

began: 2003-09-15
ended: 2003-09-11
Presented:

E-MRS Fall Meeting 2003

Electron diffraction and microscopy investigations of nanocrystals envelope

Participant:


E-MRS Fall Meeting 2005

began: 2005-09-05
ended: 2005-09-09
Presented:

Publications:


  1. Catalytic growth by molecular beam epitaxy and properties of ZnTe-based semiconductor nanowires
  2. Electron diffraction and microscopy investigations of nanocrystals envelope
  3. Image processing of HREM micrograph for determination size distribution of Co nanocrystals in Cu matrix
  4. Influence of the thin Si cap layer on SiGe quantum dots morphology
  5. Medium scale modeling of the CdTe/ZnTe islands the empirical potential and finite element approach
  6. Microstructure of Fe3O4 film grown on Si(100) substrate, investigated by TEM and X-ray methods
  7. Nanoindentation of heterogeneous n-carbon films containing Ni nanocrystals
  8. Promising high quality short period Fe/Fe-N multilayers deposited by the sputtering

  9. Properties of nanostructured carbonaceous films containing Ni nanocrystals
  10. Quantitative study of Cd atoms distribution in CdTe/ZnTe quantum dots superlattice by HRTEM
  11. Quantitative transmission electron microscopy investigation of localised stress in heterostructures
  12. Structure of Si:Mn annealed under enhanced stress conditions
  13. Transmission electron microscopy and X-ray diffraction study of α'-Al2 CO crystals
  14. X-ray Absorption Fine Structure study of nickel grains embedded in the carbonaceous films



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