- Artem Shalimov

e-mail:
phone: +48-22-8437001
fax:
web:
interest(s):

Affiliation:

Polish Academy of Sciences, Institute of Physics

address: al. Lotników 32/46, Warszawa, 02-668, Poland
phone: +48-22-8436601
fax: +48-22-8430926
web: http://www.ifpan.edu.pl

Participant:

E-MRS Fall Meeting 2003

began: 2003-09-15
ended: 2003-09-11
Presented:
E-MRS Fall Meeting 2003
Influence of substrate miscut angle on dislocation density in GaAs/Si heterostructures obtained by HRXRD

Participant:

E-MRS Fall Meeting 2006

began: 2006-09-04
ended: 2006-09-08
Presented:
E-MRS Fall Meeting 2006
Structure properties of bulk ZnO crystals

Publications:
  1. Influence of substrate miscut angle on dislocation density in GaAs/Si heterostructures obtained by HRXRD
  2. Lattice parameters changes of GaMnAs layers induced by annealing

  3. Influence of enhanced temperature and pressure on structural transformations in pre-annealed Cz-Si

  4. Structure and related properties of Si:Mn annealed under enhanced hydrostatic pressure

  5. Structural and optical properties of high temperature and high pressure treated Si:H,D
  6. Structure of Si:Mn annealed under enhanced stress conditions
  7. Structure properties of bulk ZnO crystals



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