Krzysztof Wieteska
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Affiliation:
Institute of Atomic Energy
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, Otwock-Świerk, 05-400,
Poland
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Publications:
Observation of defects in g - irradiated Cz-si annealed under high pressure
Observation of individual dislocations in 6h and 4h sic by means of back-reflection methods of x-ray diffraction topography
Synchrotron X-ray Diffraction studies of silicon implanted with high energy Ar ions after thermal annealing
X-ray topography of Ca
0.5
Sr
0.5
NdAlO
4
single crystal
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