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Wayne D. Kaplan

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Affiliation:


Technion - Israel Institute of Technology, Dept. of Materials Engineering

address: , Haifa, 32000, Israel
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Affiliation:


Technion - Israel Institute of Technology, Dept. of Materials Engineering

address: , Haifa, 32000, Israel
phone:
fax:
web:

Publications:


  1. Correlation between the dielectric constant and porosity of nanoporous silica based thin films



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