Microstructure Investigation in Nanocrystalline SiC by X-ray Diffraction and Simulation of Diffraction Pattern |
| Roman Pielaszek 3,4, Stanisław Gierlotka 4, Svetlana Stelmakh 4, Bogdan F. Palosz 4, Ewa Grzanka 3,4 |
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1. Warsaw University, Faculty of Physics, Hoża 69, Warszawa 00-681, Poland |
| Abstract |
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