Strain Distribution in nanocrystalline Silicon Carbide by X-ray Diffraction and Structure Modeling |
| Roman Pielaszek 2,3, Maria Aloszyna , Svetlana Stelmakh 3, Stanisław Gierlotka 3, Bogdan F. Palosz 3, Peter Zinn , Ulrich Bismayer 1 |
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1. University of Hamburg, Mineralogisch-Pertographisches Institut, Hamburg, Germany |
| Abstract |
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