Spectroscopic investigation of buried interfaces and liquids with soft x-rays

Clemens Heske 

Universitaet Wuerzburg, Experimentelle Physik II, Am Hubland, Würzburg 97074, Germany

Abstract

When, in general, two entities interact, they do it by forming an interface. The properties of such interfaces are determined not only by the properties of the two interface partners, but also to a large degree by the peculiarities of the interface formation process itself. This is of particular importance in solid state devices composed of two or more different materials. Unfortunately, the investigation of such interfaces is very difficult for two reasons. First they are, by their nature, buried. Secondly, interfaces generally form a thin layer within a larger ensemble and thus give very weak signals. Nevertheless, a few experimental techniques are available to study such buried interfaces. It will be the purpose of this presentation to demonstrate that a combination of soft x-ray spectroscopies (x-ray emission, photoemission, and x-ray absorption) is extremely well suited for this task. As examples, the electronic and chemical properties of several interface systems will be discussed, including II-VI-semiconductors, Cu(In,Ga)(S,Se)2 thin film solar cells, organic thin films, and liquid-solid interfaces.

Presentation: invited oral at E-MRS Fall Meeting 2003, Symposium B, by Clemens T. Heske
See On-line Journal of E-MRS Fall Meeting 2003

Submitted: 2003-05-26 10:13
Revised:   2009-06-08 12:55
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