Nano-scale surface interactions Studied by TEM-SPM
|Rynno Lohmus 1, Donats Erts 2, Ants Lohmus 1, Hakan Olin 3, Ilmar Kink 1, Justin D. Holmes 4|
1. Institute of Physics, University of Tartu, Riia str. 142, Tartu 51014, Estonia
Scanning probe microscope (SPM) in combination with transmission electron microscope (TEM), so called TEM-SPM , was used for adhesion and force interaction studies of metallic and semiconducting nanowires and nanocontacts. TEM-SPM is an attractive combined tool for direct investigation of the structure, electronic properties, and interactions in atomic scale. In TEM-SPM the size and shape of the tip and sample, as well as the size of contact area and the type of interaction (elastic/plastic), are observed directly.
Presentation: invited oral at E-MRS Fall Meeting 2003, Symposium F, by Rynno Lohmus
See On-line Journal of E-MRS Fall Meeting 2003
Submitted: 2003-05-15 10:45 Revised: 2009-06-08 12:55