Accuracy of XRD size measurements of nanocrystals

Roman Pielaszek 1,  Tadeusz Chudoba 1,  Robert Fedyk 1,2,  Agnieszka Opalińska 1,2,  Tomasz Strachowski 1,2,  Witold Łojkowski 1

1. Polish Academy of Sciences, Institute of High Pressure Physics (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland
2. Warsaw University of Technology, Faculty of Materials Science and Engineering (InMat), Wołoska 141, Warszawa 02-507, Poland

Abstract

Exploration and engeneering of size-dependent effects in nanomaterials assume knowledge and predictibility of the particle sizes being engineered. Nowdays, there are number of size characteriazation methods available, but not as many corresponding error estimations. As a result (we think) we are aware about particle size, however no error bars can be drawn around the value.

We present error estaimation for XRD grain size readings. Simple formula is given to calculate the error in % as a function of XRD peak intensity (photon count). It turns out that reasonable quality of size characterization (error below 20%) can be obtained for XRD data noise level below 2%, see figure below.

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Presentation: Oral at COST action D30 Mid term evaluation meeting, by Roman Pielaszek
See On-line Journal of COST action D30 Mid term evaluation meeting

Submitted: 2006-02-06 15:17
Revised:   2006-02-06 20:23
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