Growth and Characterisation of AgIn5S8 and CuIn5S8 Thin Films

Liudmila V. Makhova 1Igor Konovalov Rüdiger Szargan 

1. Universität Leipzig, Willhelm-Ostwald-Institut für Physikalische und Theoretische Chemie (WOI), Linnestr.2, Leipzig 04103, Germany

Abstract

Spinel CuIn5S8 and AgIn5S8 materials are perspective for application in optoelectronic semiconductor devices. For the first time, thin films of these compounds were grown and investigated. The films were deposited by sequential process on Mo-coated soda lime glass. This process consist of sulfur vapor sulfurization of a metallic alloy precursor. We found that good adhesion to the substrate (Mo-coated glass) could be achieved by introducing a Ti layer between the substrate and the spinel layer. We observed a good electrical conductivity through this contact. From analysis of the XPS data, the information about the interface spinel/Ti and composition of the surface was gained. The influence of preparation conditions, namely of the phase composition of the precursor alloy, of the sulfurization temperature and time on the stoichiometry in the bulk and at the surface of the spinel layers have been investigated by XRD, XRFA and XPS methods. Moderate roughness of the films and a crystallite size of about 300-400 nm were observed in the AFM images.

 

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Presentation: poster at E-MRS Fall Meeting 2003, Symposium A, by Liudmila V. Makhova
See On-line Journal of E-MRS Fall Meeting 2003

Submitted: 2003-05-09 12:56
Revised:   2009-06-08 12:55