Multifractal analysis in diagnostics of nanostructures
|Natalia M. Shmidt 1, S. V. Ivanov 1, A. V. Kamanin 1, A. G. Kolmakov 2, A. V. Loskutov 2, A. N. Titkov 1|
1. Ioffe Physico-Technical Institute (Ioffe), Polytechnicheskaya, 26, Saint-Petersburg 194021, Russian Federation
Materials produced by modern nanotechnology, as a rule, have a complicated structure. It should be noticed that most of diagnostic techniques characterize the materials either integrally or locally, while the methods revealing, for example, topographic peculiarities of the complicated systems do not always allow the different structures to be compared quantitatively. Moreover, traditional techniques allow no internal bindings to be revealed in complicated systems, while these bindings determine many system properties.
Presentation: oral at E-MRS Fall Meeting 2003, Symposium B, by Natalia M. Shmidt
See On-line Journal of E-MRS Fall Meeting 2003
Submitted: 2003-04-30 10:13 Revised: 2009-06-08 12:55