Mass flow and reaction analysis of the growth of GaN layers by HVPE

Pawel Kempisty 1Stanisław Krukowski 2Izabella Grzegory 2Bolesław Łucznik 2B. Pastuszka 2Michał Boćkowski 2Sylwester Porowski 2

1. Warsaw University of Technology, Department of Technical Physics and Applied Mathematics, Warszawa, Poland
2. Polish Academy of Sciences, Institute of High Pressure Physics (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland

Abstract

HVPE growth in horizontal flow reactor has been analyzed using finite element calculation and molecular estimates of the reaction rates. The reaction rate of the HCl with liquid Ga has been estimated using ideal gas approximation for HCl vapor. The conversion HCl to GaCl rate has been obtained in function of the pressure, temperature, flow velocity and the geometry of the reactor.

Finite element code FIDAP (commercially available from Fluent Inc.) has been used to calculate the flow pattern in the reactor. In the first approximation it was assumed that the flow pattern is weekly dependent on the temperature distribution in the reactor. It was also assumed that the volume reaction rates can be approximated by temperature independent reaction constants.

Using these calculation it was possible to obtain the reaction rates on the susceptor surface. The reaction rate leads to different growth rates depending on the geometry of the susceptor and the distance between the flow outlets. The calculated reaction rates were compared with the measured growth rate in horizontal, normal pressure HVPE reactor.

Additionally , the parasitic reaction on the pipe close to the gas inlets was observed. It was shown that the reaction is strongly inhomogeneous, depending on the geometry of the inlets. The reaction depends on the flow velocity and the pressure. The obtained reaction rates were compared with the estimates drown from the growth experiments.

Related papers
  1. Carrier recombination under one-photon and two-photon excitation in GaN epilayers
  2. Modelling of the growth of nitrides in ammonia rich environment
  3. Transport properties on nitrogen at high pressure and temperature: viscosity – MD study.
  4. Adsorption processes during growth of GaN by HVPE
  5. Rietveld refinement for polycrystalline indium nitride
  6. GaN(0001) surface Fe atoms doped
  7. Microstructure of homoepitaxially grown InGaN/GaN, violet light emitting laser diodes.
  8. Anomalous behaviour of the photoluminescence from GaN/AlGaN quantum wells
  9. Built-in electric fields in group III-nitride light emitting quantum structures
  10. Bowing of epitaxial structures grown on bulk GaN substrates
  11. Interaction of Mn and Ti atoms with GaN surface - a resonant photoemission study
  12. The optimalisation of the GaN and GaN/AlGaN heterojunctions on bulk crystals using plasma-assisted molecular beam epitaxy
  13. Compensation mechanisms in magnesium doped GaN
  14. Gallium nitride surface formation and modification by Mn deposition - photoemission studies with use of synchrotron radiation

Presentation: poster at E-MRS Fall Meeting 2005, Symposium A, by Pawel Kempisty
See On-line Journal of E-MRS Fall Meeting 2005

Submitted: 2005-06-06 12:45
Revised:   2005-06-07 07:52
Google
 
Web science24.com
© 1998-2008 pielaszek research, all rights reserved Powered by the Conference Engine