Structural and magnetic characterization of thin films prepared by ion beam deposition
|Diana C. Leitão 1, Joao P. Araujo 1, J. B. Sousa 1, Isabel G. Trindade 1, Jose Teixeira 1, Rui J C. Silva|
1. Departamento de Fisica and IFIMUP, Universidade do Porto (UP), Rua do Campo Alegre, 687, Porto 4169-007, Portugal
Polycrystalline magnetic thin films of NiFe and Co, with different thicknesses and underlayers were prepared by ion beam deposition. During film growth, a magnetic field was applied to the substrates to induce a uniaxial ansisotropy field. The film’s structural phase and texture was characterized by x-ray diffraction, revealing a strong dependence on the thickness of the magnetic layers and/or type of underlayer. A MOKE set-up sensitive to both in-plane magnetization components was used to study the magnetization and reversal magnetization processes. These studies were complemented by MOKE domain imaging and magnetoresistance measurements. The MOKE imaging unit, using a CCD camera for Kerr effect domain visualization, provides direct evidence on the magnetization and reversal mechanisms, namely domain wall nucleation, domain wall propagation and magnetization rotation. The dependence of the electrical resistivity on the short-range spin disorder and on the angle between the magnetization and the electrical current (anisotropic magnetoresistance) provided further information on the reversal mechanisms. A correlation between the magnetic properties and the structural phase of the films is described.
Presentation: poster at E-MRS Fall Meeting 2005, Symposium D, by Diana C. Leitão
See On-line Journal of E-MRS Fall Meeting 2005
Submitted: 2005-05-23 18:03 Revised: 2009-06-07 00:44