Scanning Electron Microscopy Investigations and Analysis of Nanostructures
|Adam M. Presz , Jan T. Mizeracki , Witold Łojkowski|
Several examples will be given on application of Field Emission Scanning Electron Microscopy in the studies of nanopartciles and nanostrcutres, including polymers. Application of BSE detector, in-lens detector and other detectors will be ilustrated. Methods to optimise the image will be explained.
Presentation: Polish Research Projects at Nano and Advanced Materials Workshop and Fair, by Adam M. Presz
See On-line Journal of Nano and Advanced Materials Workshop and Fair
Submitted: 2013-08-11 20:22 Revised: 2013-09-06 23:12