Studies the size of palladium nanoparticles in Pd-C films annealing at different temperatures.

Kamil Sobczak 1Jerzy Dąbrowski 1Bogusława Kurowska 1Halina Wronka 2Joanna Radomska 2

1. Instytut Fizyki PAN, Al. Lotnikow 32/46, Warszawa 02668, Poland
2. Instytut Tele i Radiotechniczny (ITR), Ratuszowa 11, Warszawa 03-450, Poland

Abstract

Methods of Transmission Electron Microscopy (TEM) were used to research carbon porous-palladium composites. The investigated composites were obtained in two different processes: Physical Vapour Deposition (PVD) and Chemical Vapour Deposition (CVD). The relation between an average size of palladium particle and the time and also temperature were carried out. The samples were annealed at different temperatures –Alpha from 500ºC to 750ºC and Alphain three different times that is: 5 min, 10 min and 30 min in argon atmosphere. Activation energies were calculated from the Arrhenius equation and obtained values ​​for PVD and PVD/CVD samples is: 64.6 kJ / mol and 38.8 kJ /mol respectively. Determination of activation energy would be useful in controlling the growth of palladium grain. Significant differences in this values ​​ was caused that palladium particles obtained in the PVD/CVD process, were encapsulated in graphite. AlphaThose graphite planes are formed in temperatures above 600ºC and blocks the growth of palladium particles.

ACKNOWLEDGEMENTS

This research was co-financed by the European Regional Development Fund within the Innovative Economy Operational Programme 2007-2013 (“Development of technology for a new generation of the hydrogen and hydrogen compounds sensor for applications in above normative conditions”. No UDA-POIG. 01.03.01-14-071/08-06 and “Analytical high resolution transmission electron microscope for nanoscience, nanotechnology and spintronics” No POIG.02.01-00-14-032/08.

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Presentation: Poster at Nano and Advanced Materials Workshop and Fair, by Kamil Sobczak
See On-line Journal of Nano and Advanced Materials Workshop and Fair

Submitted: 2013-07-09 12:05
Revised:   2013-07-09 12:34
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