Image processing of HREM micrograph for determination size distribution of Co nanocrystals in Cu matrix

Mirosław Kozłowski 1,3,  Marcin Żak 1,  Tomasz Wójtowicz 2,  Pierre Ruterana 2,4,  Slawomir Kret 1,  Jerzy Dąbrowski 1,  Piotr Dłużewski 1

1. Polish Academy of Sciences, Institute of Physics, al. Lotników 32/46, Warszawa 02-668, Poland
2. Laboratoire CRISMAT - UMR 6508, ISMRA et Universite de Caen, 6 Boulevard de Marechal JUIN, Caen 14050, France
3. Industrial Institute of Electronics (PIE), Dluga, Warszawa 00-241, Poland
4. SIFCOM, UMR6176, CNRS-ENSICAEN, 6 Bld Maréchal Juin, Caen 14050, France

Abstract

Image processing combined with transmission electron microscopy is a powerful tool for investigation of size distribution of nano-objects. The high-resolution, bright- and dark-field images recorded on photo plates were digitalized and used as an input data for image analysis.
The Fourier filtering, autocorrelation, methods were applied for outline determination of Co precipitates.
The influence of digitising condition, size and shape of Fourier masks, and parameters of reference regions will be discussed in respect to obtained results.

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Presentation: poster at E-MRS Fall Meeting 2004, Symposium D, by Marcin Żak
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-08-06 23:14
Revised:   2004-08-06 23:29
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