High brilliance, third generation, synchrotron radiation sources push the spatial resolution of non-destructive X-ray tomographic investigations down to the micrometer or even submicrometer range while the coherent nature of the radiation extends the traditional absorption imaging techniques towards
edge-enhanced or phase-sensitive measurements. Presently used detectors based on scintillation screens optically coupled to charge coupled devices (CCDs) are limited to a practical spatial resolution or 1 micrometer with efficiencies of a few percent. A recently developed new detector, called Bragg magnifier, exploits double asymmetrical Bragg diffraction from flat crystals to efficiently produce distortion- and aberrations-free X-ray images. For the present prototype, magnification factors as high as 150x150 can be reached, corresponding to a pixel size less than 100 x 100 nm².

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