(1) Prudnikov A.M., (2) Misiuk A., (1) Efros B.M., (3) Tyschenko I.E. and (1) Shishkova N.V.
---------------------------------------------------------------------------------------------------------------------------------
(1) Donetsk Physics & Technology Institute of the NASc of Ukraine, 72, R.Luxemburg, St., 83114, Donetsk, Ukraine; (2) Institute of Electron Technology, Warsaw, Poland, (3) Institute of Semiconductor Physics, Novosibirsk, 630090, Russia.
_{________________________________________________}
The DAC method allows one to carry out investigations in situ of structure and properties at sub and megabar pressures. This method can be effected for solid-phase transformation study at different matter under pressure. With this aim on the basis of optical microscope, DAC and spectrometer the device for optical and spectral investigations under pressure and pressure measuring has been developed. Using of spectrometer with linear dispersion 4.5A/mm allows one to measure by ruby the pressure with the accuracy of 30 MPa. This device allows one to study optical absorption, reflection and luminescence of studied samples under pressure in situ with minimum area 20x20(m2 into spectral range 0.25-1.8(m. There is a high sensible television camera at this device allowing one to observe sample behaviour in situ in this wavelength range. As a result of this it is possible to reveal the structure and phase transitions in different samples of materials in the DAC. Experimental device was used for obtaining experimental absorption spectra of Si-SiO2-x sample in DAC at hydrostatic pressure up to 20 GPa.