Temperature dependencies of optical parameters of 1H[3,4-b]chinoline films used in electroluminescence devices

Janusz Jaglarz ,  Jerzy Sanetra 

Cracow University of Technology, Institute of Physics (PK), Podchorążych 1, Kraków 30-084, Poland


electroluminescence cells with H[3,4-b]chinoline and 9winylecarbazole [PAQ] layers are promising devices for blue light emitting EL diode. In this work optical reflectance as a function of temperature in copolymers PAQ layers deposited on Si crystalline substrate was measured. Using the Cauchy model of reflectance versus wavelength the refraction coefficient and thickness of the films were determined in temperature ranges from 76 K to 300 K.


Related papers
  1. Antireflective properties of silica films formed in sol-gel processes
  2. Fourier analysis of optical profilometry and BRDF in paints art investigations
  3. Optical investigation of surface morphology of the WC tool-plate subjected to nitriding preprosessing
  4. Study on photovoltaic devices based on polymer and SiC nanoparticles
  5. Characterization of Polyazomethine thin films by optical measurements
  6. Surface investigations of TiN layers on different substrates
  7. Irradiance measurements of electroluminescence PAQ films
  8. Determination of steel surfaces roughness subjected to etching and oxidation processes
  9. Determination of optical parameters of polyazomethine thin films by reflectance measurements.

Presentation: poster at E-MRS Fall Meeting 2004, Symposium G, by Janusz Jaglarz
See On-line Journal of E-MRS Fall Meeting 2004

Submitted: 2004-05-03 23:16
Revised:   2009-06-08 12:55