The results of study of the total, diffuse and specular reflectance of thin poliazomethine films on fused sillica and Si substrates are reported. The layers was deposited by polycondensation method of initial substrates. The main optical parameters i.e energy loss function, absorption, and scatter refraction coefficient were determined. The values of rms roughness were found using AFM microscope, Talysurf profilometer and integrating sphere.

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