Estimation of crystallographic defects density in ceramics from ESEM/EBSD data

Krzysztof Sztwiertnia 1Marek A. Faryna 1Henryk Tomaszewski 2

1. Polish Academy of Sciences, Institute of Metallurgy and Materials Sciences (IMIM PAN), Reymonta 25, Kraków 30-059, Poland
2. Institute of Electronic Materials Technology (ITME), Wólczyńska 133, Warszawa 01-919, Poland

Abstract

Several properties of materials depend, to a large extent, on the character and distribution of crystallographic defects. This paper proposes a method to estimate the density of these defects at defined points of the sample, based on quantitative Electron BackScatter Diffraction (EBSD) data analysis in Environmental Scanning Electron Microscope (ESEM). The principle of the method is based on the effect of the diffraction lines broadening at each point where the local density of defects rises. The work presents a few examples of analysis of alumina and zirconia ceramics, which surfaces were deformed by shoot pining. The method appears easy to be for implementation, provided that several conditions, discussed in the paper, are met.

 

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Presentation: Invited oral at E-MRS Fall Meeting 2008, Symposium I, by Marek A. Faryna
See On-line Journal of E-MRS Fall Meeting 2008

Submitted: 2008-05-14 09:45
Revised:   2009-06-07 00:48