Well established Scherrer method allows for determination of the average grain size  <R> of a crystalline powder by measurement of Full Width at Half Maximum ( FWHM ) of the diffraction peak profile. We propose an enhancement of this classical method. Measurement of two widths of the same peak, allows for two parameters to be distinguished: the average grain size <R> and dispersion of sizes σ. These parameters are sufficient to draw Grain Size Distribution (GSD) curve, that is much more informative than a single size parameter <R>.

We propose to measure widths at 1/5 and 4/5 of the peak maximum ( FW1/5M and FW4/5M , respectively). A simple algebraic formula that converts measured FW1/5M and FW4/5M values into <R> and σ is presented. The FW1/5-4/5M method proposed in this paper is especially sensitive in case of a broad diffraction maxima, i.e. for nano-sized polycrystals.

Journal of alloys and compounds, 392, pp. 128-132

1. FULLTEXT: FW1/5-4/5M method for determination of the Grain Size Distribution from powder diffraction line profile, PDF document, version 1.3, 0.9MB

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1. Initial abstract
2. 2nd abstract
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