FW1/5-4/5M method for determination of the Grain Size Distribution from powder diffraction line profile

Roman Pielaszek 

Polish Academy of Sciences, High Pressure Research Center (UNIPRESS), Sokolowska 29/37, Warszawa 01-142, Poland


Well established Scherrer method allows for determination of the average grain size  <R> of a crystalline powder by measurement of Full Width at Half Maximum ( FWHM ) of the diffraction peak profile. We propose an enhancement of this classical method. Measurement of two widths of the same peak, allows for two parameters to be distinguished: the average grain size <R> and dispersion of sizes σ. These parameters are sufficient to draw Grain Size Distribution (GSD) curve, that is much more informative than a single size parameter <R>.

We propose to measure widths at 1/5 and 4/5 of the peak maximum ( FW1/5M and FW4/5M , respectively). A simple algebraic formula that converts measured FW1/5M and FW4/5M values into <R> and σ is presented. The FW1/5-4/5M method proposed in this paper is especially sensitive in case of a broad diffraction maxima, i.e. for nano-sized polycrystals.

Journal of alloys and compounds, 392, pp. 128-132


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Presentation: Article at NANO Ceramics and Grain Boundaries Lab, by Roman Pielaszek
See On-line Journal of NANO Ceramics and Grain Boundaries Lab

Submitted: 2004-02-24 18:36
Revised:   2016-04-09 11:50