Morphological and magnetic properties of cobalt nanostructures fabricated by focused ion beam
|Jerzy Jaworowicz 1,2, Marek Kisielewski 1,2, Jacques Ferre 1, Nicolas Vernier 1, Jean-Pierre Jamet 1, Vitalii Zablotskii 1,2,3, Andrzej Maziewski 2, Iosif Sveklo 2, Jacques Gierak 4, Eric Bourhis 4|
1. Laboratoire de Physique des Solides Université Paris-Sud (CNRS UMR8502), Orsay 91405, France
Controled and reproducible fabrication of nanostructured materials are one of the main chalenges for next years. High resolution focused-ion-beam (FIB) patterning has been recently used to pattern magnetic nanoelements [1,2] . 30-keV Ga+ ions were focused on to ultrathin Pt/Co(3 nm)/Pt film as a 5 nm beam spot diameter to create arrays of square nanodots, nanostripes and irradiated narrow lines. Atomic Force Microscopy (AFM) evidence a film wetting effect  in FIB-irradiated regions and, for high doses the sputtering of the film surface. Considering the above film with in plane magnetization, high resolution Magneto-optical Kerr Microscopy combined with Magnetic Force Microscopy reveal that out-of-plane magnetization states can be generated by choosing properly patterning and dose in the FIB process. Particular magnetization configurations near edges of FIB affected areas are observed and discussed taking into consideration the edge effect recently predicted in .
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Presentation: Poster at E-MRS Fall Meeting 2007, Acta Materialia Gold Medal Workshop, by Jerzy Jaworowicz
See On-line Journal of E-MRS Fall Meeting 2007
Submitted: 2007-05-21 20:53 Revised: 2009-06-07 00:44