E-MRS Fall Meeting 2007

 on-line journal

Presenting person

September 17th, Monday

14:00 00:35:00 Invited James N. Hilfiker Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry
14:35 00:20:00 Oral Peter Petrik Nanocrystals characterization in porous silicon using model dielectric function
14:55 00:20:00 Oral Jordi Sancho Parramon Optical characterization of HfO2 by spectroscopic ellipsometry: dispersion models and direct data inversion
15:15 00:20:00 Oral Mickael Gilliot Use of Gaussian Voigt oscillators to characterize microelectronics materials by Spectroscopic Ellipsometry.

September 18th, Tuesday

09:00 00:35:00 Invited Vaclav Holy Structural characterization of semiconductor quantum dots by three-dimensional x-ray diffraction mapping in reciprocal space
09:35 00:35:00 Invited Vincent Favre-Nicolin Shape and stacking analysis of semiconductor nanowires using grazing-incidence diffraction and coherent scattering on single nanowires
11:00 00:35:00 Invited Poul-Erik Hansen Fast hybrid scalar and Fourier modal method for scatterometry with least square measurements validation
11:35 00:20:00 Oral Pietro G. Gucciardi Nanoscale resolution sub-surface fluorescence imaging with aperture Scanning Near-Field Optical Microscopy
11:55 00:20:00 Oral Josep Ferre-Borrull FTIR Characterization of Photonic Bands in 2D Silicon Photonic Crystals
14:00 00:35:00 Invited John D. Budai Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies
15:10 00:20:00 Oral Andrzej Kuczumow Production of metallic X-ray capillaries with nanometer-rough reflecting surfaces
15:50 00:35:00 Invited Grzegorz Sęk Advances in contactless forms of modulation spectroscopy for probing the optical properties of nano-scale objects
16:25 00:35:00 Invited Jeff Hosea Photoreflectance in the mid-infrared : a study of the bandgaps and spin-orbit splittings of ternary and pentenary InAsSb-based alloys
17:00 00:20:00 Oral Piotr Sitarek Surface photovoltage spectroscopy of quantum well and quantum dot systems

September 19th, Wednesday

11:00 00:35:00 Invited Ullrich Pietsch Grazing-incidence X-ray diffraction from free-standing InAs/GaAs nanorods
11:35 00:35:00 Invited Alain P. Gibaud The analysis of mesostructured thin films by grazing incidence x-ray scattering techniques
12:10 00:20:00 Oral Laura Depero The international VAMAS project “X-ray reflectivity measurements for evaluation of thin films and multilayers” for X-Ray metrology
14:00 00:35:00 Invited Pietro G. Gucciardi Study of the light depolarization induced by sharp dielectric and metallic tips and of its effects on the selection rules of polarized Tip-Enhanced Raman Scattering on crystals
14:35 00:20:00 Oral Gerald E. Jellison Normal-incidence generalized ellipsometry: learning more about the optics of graphite
14:55 00:20:00 Oral Stergios Logothetidis In-Situ and Real-Time Protein Adsorption Study by Spectroscopic Ellipsometry
15:15 00:20:00 Oral Tivadar Lohner Ellipsometric and ion beam analytical studies on sputtered and annealed niobium oxide thin films

September 20th, Thursday

09:00 00:35:00 Invited Davor Balzar X-ray Characterization of Crystalline Defects and Strains in Thin Films
09:35 00:35:00 Invited Michel Eberlein Influence of crystallographic orientation on local strains in silicon: a combined High-Resolution X-Ray Diffraction and Finite Element Modelling investigation
10:10 00:20:00 Oral Emil Zolotoyabko Strain measurements with depth resolution by energy-variable X-ray diffraction
11:00 00:35:00 Invited Alexandre Boulle Investigation of strain and strain relaxation in functional epitaxial oxides using X-ray scattering techniques
11:35 00:20:00 Oral Karolina Galicka-Fau Thickness determination of monolayered or multilayered SrZrO3 thin films using XRD reflectometry
11:55 00:20:00 Oral Gerald E. Jellison Photoelectrochemical studies of semiconducting photoanodes for hydrogen production via water dissociation
12:15 00:20:00 Oral Ciceron A. Berbecaru Ceramic materials Ba (1-x) SrxTiO3 for electronics – synthesis and characterization
14:10 00:20:00 Oral Michael J. Nolan Dopant Ionic Radius and Electronic Structure Effects on the Transparency of Doped Cu2O Transparent Conducting Oxide
14:30 00:20:00 Oral Mircea Modreanu Investigation on optical properties and conduction mechanism of p-type SrCu2O2
14:50 00:20:00 Oral Evie L. Papadopoulou The effect of PLD deposition parameters on the properties of p-SrCu2O2/n-Si diodes
15:10 00:20:00 Oral Ekaterina Chikoidze Effect of Chlorine doping on electrical and optical properties of ZnO thin films
15:50 00:20:00 Oral Jean-Luc Deschanvres  Study of the growth conditions of SrCu2O2 thin films deposited by injection MOCVD
16:10 00:20:00 Oral Michael J. Nolan Defects and the Origin of p-Type Conductivity in Cu2O: a First Principles Investigation
16:30 00:20:00 Oral Károly Somogyi Combination of the Optical Waveguide Lightmode Spectroscopy Method with Electrochemical Measurements
16:50 00:20:00 Oral Elias Aperathitis Optical properties of ZnN thin films fabricated by rf-sputtering from ZnN target
17:10 00:20:00 Oral Antonis Kondilis Derivation of the complex refractive index in the infrared region of the spectrum from the analysis of optical measurements

September 21st, Friday

09:00 00:20:00 Oral Martina Von Der Ahe An old technique (Umweganregungen) for X-ray characterization of an epitaxial new material ( Chromium doped GaN)
09:20 00:20:00 Oral Evie L. Papadopoulou Undoped and Al-doped ZnO films with tuned properties by pulsed laser deposition
09:40 00:20:00 Oral Nicolae Tomozeiu Electrical Conduction and Dielectric Relaxation of a-SiOx (0<x<2) Thin Films Deposited by Reactive r.f. Magnetron Sputtering
10:00 00:20:00 Oral Vladimir Egorov Possibilities of thin film multilayer structures study by X-ray and ion beam complex of nondestructive methods
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